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  Name                       : Sipeng Gu        

  Email                       :  sg75@njit.edu

  Research Advisor : Dr. Roland Levy

 

  Academic Background :

     

    M.S. Materials Science, Shanghai Institute of

    Optics and Fine Mechanics,

    Chinese Academy of Sciences, 1998-2001

B.S. Materials Science and Engineering, Zhengzhou University, 1994-1998

Currently Pursuing Phd in Materials Science and Engineering .

 Work Experience :

 

Research Assistant, The High Density Optical Storage Laboratory,  Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, 2001-2003

 

 Memberships :  The Optical Society of America Membership

 

 Research Interests:

 

 Chemical vapor deposition of thin films using environmentally benign precursors; 

 Physical vapor deposition semiconductor coatings for high density optical storage

 media

 

 Current Research Work : 

                                   Investigate the use of APCVD to produce high quality

 metal coatings for corrosion for  protection of high strength steels using

 environmentally benign precursors.

 

 

 

 Sipeng  investigates the use of Atmospheric chemical vapor deposition (APCVD)

 to produce high quality metal coatings for corrosion protection of high strength

 steels using environmentally benign precursors.

 In addition to offering an environmentally benign alternative to cadmium plating,

 this process promises to provide high production throughput and  low cost. 

 

 

 His research involves the investigation of the growth kinetics of the deposition

 mechanism, determination of coating composition, Characterization of deposits in

 terms of their mechanical, structural, morphological, electrical and optical

 properties.  Evaluation of coating performance through a complete series of test

 is also conducted.

 

 Sipeng's  Previous Research Work :

                                                 Deposited Si3N4 thin films using sputtering

 Synthesized Aluminum thin films on steel substrate using APCVD  Studied

 structural, compositional, electrical and mechanical properties of thin films by

 XRD, SEM, AES, XPS, AFM, etc.

 

 For more information about Sipeng's project contact sg75@njit.edu or Dr.

 Roland levy.

 

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New Jersey Institute of Technology
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