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  Name               : Seth Sudhakar       

  Email               : ss63@njit.edu

  Research Advisor : Dr. N.M. Ravindra and Dr. Anthony T. Fiory

 

  Academic Background :

 

            B.S. in Metallurgy & Materials Engineering

                    M.S. in Materials Science and Engineering

            Currently Working towards PhD in Materials Science and Engineering

      

 Work Experience :

                                   Worked as an engineer in metal, automobile, & glass industry for 5 years. Taught Physics laboratory course to B.S. students.

 

Worked as a Research Assistant & Teaching Assistant.

 

 Research Interests:

                            Fabrication and characterization of Semiconductor materials

 and devices. Nanomaterials,Materials synthesis, testing and characterization.

 

 Current Research Work : 

                                    Currently, he  is working on the magnetic field

 assisted assembly for heterogeneous integration of different device functions

 onto the same substrate along with the method of bonding different wafers or

 materials. As demand for low cost, high performance system increases, there is

 a need for new assembly & integration techniques for assembling different

 devices, such as III-V compounds with silicon integrated circuits onto the

 same substrate to produce low cost, powerful complex Microsystems. Primary

 interest is in combining electrical, optoelectronic and MEMS with Si CMOS

 technology to increase number of on-wafer functions and to decrease cost,

 size and weight of the system.

 

Probe Station is used for Resistivity and sheet resistance measurement .

 

 For more information related to project contact Dr. Ravindra or Sudhakar.

 

 Previous Research Work Experience :

                                                   Shallow junction formation and characterization in

 sub-micron MOSFETs.Boron containing corrosion resistant coatings on steel. 

 

 Publications :

 

 1. Nuggehalli M. Ravindra, Krshna N. Ravindra, Markus Rabus, Vishal R. Mehta,

  Stephen E. Rubin, Sudhakar Shet and Anthony T. Fiory. Applications of Spectral

  Emissometry, Materials  Science & Technology 2005, Symposium,Sept. 25-28 .

 

 2. N.M.Ravindra, vishal R Mehta and Sudhakar Shet, Silicon Nanoelectronics and

   Beyond-An Overview & Recent Developments, Journal of Materials (JOM) 57 (6)

   , June 2005, pp-16-20.

 

 3. Vishal R Mehta, Sudhakar Shet, N.M.Ravindra , Anthony T.Fiory, and Martin P.

   Lepselter, Silicon Integrated uncooled Infrared Detectors: Perspectives on Thin

   Films and Microstructures, Journal of Electronic Materials (JEM), Vol. 34, No. 5,

   2005, pp-484-490.

 

 4. Sudhakar Shet, Vishal R Mehta, Anthony T.Fiory, Martin P. Lepselter and

 N.M.Ravindra.The Magnetic Field-Assisted Assembly of Nanoscale Semiconductor

 Devices: A New Technique,* Journal of materials (JOM) 56(10), pp 32-34,

 October 2004.

 

 5.  Sudhakar Shet, Vishal R Mehta, Anthony T.Fiory, Martin P. Lepselter and

  N.M.Ravindra. Self-Assembly of Semiconductor Devices- Review and

  Applications, invited talk, ASM materials solutions conference & show, October

  18-21, 2004,Columbus, OH (USA).

 

 6. Sudhakar Shet, Vishal R Mehta, Anthony T.Fiory, Martin P. Lepselter and

   N.M.Ravindra. Macro-Assembly Techniques of Semiconductor Devices, 2005 
  TMS annual meeting & exhibition, February 13-17, 2005,  San Francisco, 
  California, Journal of materials (JOM) 56 (11), pp 300, October 2004.

 

 7. N.M.Ravindra, Sudhakar Shet, Vishal R Mehta, Anthony T.Fiory, Stephen Rubin and Markus Rabus,. Temperature Dependent Infrared Properties of InP, AlN, Al2O3 and Er2O3, 2005 TMS annual meeting & exhibition, February 13-17, 2005, Journal of materials (JOM) 56 (11), pp 22, October 2004. San Francisco, California.

 

 PATENTS:     

 

 1.“Method of Magnetic Field Assisted Self-Assembly”. US patent application

   number 20050250229.

 

 2.“A Method of Wafer Bonding and Bonding Semiconductor on Insulator” Patent

  application in process.

 

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Quartz Furnance is used

 for anhealing and

 oxidation experiments.

 

 

 Spectral Emissometer  

 used for simultaneous

 reflectance,transmittance

 ,emittance and temp.

 measurement.

 

 

 

 Optical Microscope is   

 used for evaluation of

 Surface  morphology

 

 

   

 Materials Science and Engineering  Program,

New Jersey Institute of Technology
University Heights
Newark, New Jersey 07102-1982 . Phone 973-596-3562
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